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MIL PRF 19500/755-2010 (Collection)  Semiconductor Device, Field Effect Radiation Hardened (Total Dose And Single Event Effects) Transist

标准编号:MIL PRF 19500/755-2010 (Collection)
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中文标准名称:Semiconductor Device, Field Effect Radiation Hardened (Total Dose And Single Event Effects) Transist
英文标准名称:Semiconductor Device, Field Effect Radiation Hardened (Total Dose And Single Event Effects) Transistor, N-Channel, Silicon, Types 2N7588t3, 2N7590t3, 2N7592t3 And 2N7594t3, Jantxvr, Jantxvf, Jansr And Jansf - (Collection)
标准状态:Current
语言:英文版, 中文版
标准类别:美国军标MIL
中国标准文献分类法(中标分类CCS):
中国标准文献分类法(中标分类CCS):
标准页数:23
标准简介:
文件格式:纸质版或者PDF电子版(用Acrobat Reader打开)或Word版本doc格式
PDF格式 MIL PRF 19500/755-2010 (Collection) Semiconductor Device, Field Effect Radiation Hardened (Total Dose And Single Event Effects) Transist 免费下载 Word格式 MIL PRF 19500/755-2010 (Collection) Semiconductor Device, Field Effect Radiation Hardened (Total Dose And Single Event Effects) Transist 免费下载免费标准下载
文件大小:237 KB
添加时间:2018/03/24
 
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